The diffuse background intensity of α-Cu2Se was observed by the anomalous X-ray scattering (AXS) measurement at the Cu iT-absorption edge using synchrotron radiation. The theoretical treatment including the effects of the correlation between the thermal displacements of atoms was applied to the analysis of the observed diffuse background of a-Cu2Se. The structural model for a-Cu2Se formerly reported by the present authors has been confirmed by the analysis of the diffuse background.
ASJC Scopus subject areas
- Physics and Astronomy(all)