Diffraction contrast analysis of 90° and 180° ferroelectric domain structures of PbTiO3 thin films

Kenta Aoyagi, Takanori Kiguchi, Yoshitaka Ehara, Tomoaki Yamada, Hiroshi Funakubo, Toyohiko J. Konno

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)


The ferroelectric domain structure of a PbTiO3 thin film on (100) SrTiO3 has been investigated by transmission electron microscopy (TEM). Two types of a-domain were found: one extended through the film to the surface and another comprised small a-domains confined within the film. Dark-field TEM (DFTEM) observation revealed that 180° domains formed near the substrate and stopped their growth 100 nm away from the substrate. The DFTEM observation also revealed that 90° domain boundaries had head-to-tail structures. To confirm the polarization direction obtained by experiments, diffracted intensities under a two-beam condition were simulated using the extended Darwin-Howie-Whelan equations. On the basis of the obtained results, a ferroelectric domain structure model of PbTiO3 thin films on SrTiO3 is proposed.

Original languageEnglish
Article number034403
JournalScience and Technology of Advanced Materials
Issue number3
Publication statusPublished - 2011 Jun


  • Ferroelectric thin film
  • PbTiO3
  • TEM

ASJC Scopus subject areas

  • Materials Science(all)


Dive into the research topics of 'Diffraction contrast analysis of 90° and 180° ferroelectric domain structures of PbTiO<sub>3</sub> thin films'. Together they form a unique fingerprint.

Cite this