Differences in structure and magnetic behavior of Mn-AlN films due to substrate material

Takanobu Sato, Yasushi Endo, Fumiyoshi Kirino, Ryoichi Nakatani

Research output: Contribution to journalArticlepeer-review

Abstract

The structure and magnetic behavior of Mn-AlN (Al1-xMn xN, x 0.03, 0.04) films deposited on thermally oxidized Si (001) substrates and sapphire (0001) substrates were studied. Mn-AlN films deposited on each substrate had a würtzite-type AlN phase with a preferentially oriented c-axis. Mn-AlN films that were deposited on Si (001) substrate exhibited paramagnetic behavior. In addition to paramagnetic behavior, weak ferromagnetic behavior with curie temperatures higher than room temperature were observed for Mn-AlN films deposited on sapphire (0001) substrates.

Original languageEnglish
Article number012032
JournalJournal of Physics: Conference Series
Volume165
DOIs
Publication statusPublished - 2009

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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