Difference in distribution of eu ions doped CaF2 single crystal caused by two types of grown method by measurement of multi-photon luminescence

Miho Tanaka; Shingo Ono; Akihiro Yamaji; Shunsuke Kurosawa; Akira Yoshikawa

doi:10.1109/CLEOPR.2017.8119055

Difference in distribution of eu ions doped CaF₂ single crystal caused by two types of grown method by measurement of multi-photon luminescence

Miho Tanaka, Shingo Ono, Akihiro Yamaji, Shunsuke Kurosawa, Akira Yoshikawa

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We report on distribution of Eu ions doped CaF₂ single crystal by measurement of multi-photon luminescence. Distribution of Eu²⁺ and Eu³⁺ ions is measured respectively because the luminescence peak due to Eu²⁺ and Eu³⁺ ions is different. We observed the difference in distribution of Eu²⁺ and Eu³⁺ ions doped CaF₂ which is grown by Annealing method and micro pulling-down method.

Original language	English
Title of host publication	2017 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2017
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1-2
Number of pages	2
Volume	2017-January
ISBN (Electronic)	9781509062904
DOIs	https://doi.org/10.1109/CLEOPR.2017.8119055
Publication status	Published - 2017 Nov 22
Event	2017 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2017 - Singapore, Singapore Duration: 2017 Jul 31 → 2017 Aug 4

Other

Other	2017 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2017
Country/Territory	Singapore
City	Singapore
Period	17/7/31 → 17/8/4

Keywords

Europium
Femtosecond laser
Luminescence
Multi-photon

ASJC Scopus subject areas

Computer Networks and Communications
Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics

Access to Document

10.1109/CLEOPR.2017.8119055

Cite this

Tanaka, M., Ono, S., Yamaji, A., Kurosawa, S., & Yoshikawa, A. (2017). Difference in distribution of eu ions doped CaF₂ single crystal caused by two types of grown method by measurement of multi-photon luminescence. In 2017 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2017 (Vol. 2017-January, pp. 1-2). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CLEOPR.2017.8119055

Difference in distribution of eu ions doped CaF₂ single crystal caused by two types of grown method by measurement of multi-photon luminescence. / Tanaka, Miho; Ono, Shingo; Yamaji, Akihiro et al.

2017 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2017. Vol. 2017-January Institute of Electrical and Electronics Engineers Inc., 2017. p. 1-2.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Tanaka, M, Ono, S, Yamaji, A , Kurosawa, S & Yoshikawa, A 2017, Difference in distribution of eu ions doped CaF₂ single crystal caused by two types of grown method by measurement of multi-photon luminescence. in 2017 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2017. vol. 2017-January, Institute of Electrical and Electronics Engineers Inc., pp. 1-2, 2017 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2017, Singapore, Singapore, 17/7/31. https://doi.org/10.1109/CLEOPR.2017.8119055

Tanaka M, Ono S, Yamaji A , Kurosawa S , Yoshikawa A. Difference in distribution of eu ions doped CaF₂ single crystal caused by two types of grown method by measurement of multi-photon luminescence. In 2017 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2017. Vol. 2017-January. Institute of Electrical and Electronics Engineers Inc. 2017. p. 1-2 doi: 10.1109/CLEOPR.2017.8119055

@inproceedings{0456cb2874524826bee0e9b249f948aa,

title = "Difference in distribution of eu ions doped CaF2 single crystal caused by two types of grown method by measurement of multi-photon luminescence",

abstract = "We report on distribution of Eu ions doped CaF2 single crystal by measurement of multi-photon luminescence. Distribution of Eu2+ and Eu3+ ions is measured respectively because the luminescence peak due to Eu2+ and Eu3+ ions is different. We observed the difference in distribution of Eu2+ and Eu3+ ions doped CaF2 which is grown by Annealing method and micro pulling-down method.",

keywords = "Europium, Femtosecond laser, Luminescence, Multi-photon",

author = "Miho Tanaka and Shingo Ono and Akihiro Yamaji and Shunsuke Kurosawa and Akira Yoshikawa",

year = "2017",

month = nov,

day = "22",

doi = "10.1109/CLEOPR.2017.8119055",

language = "English",

volume = "2017-January",

pages = "1--2",

booktitle = "2017 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2017",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "2017 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2017 ; Conference date: 31-07-2017 Through 04-08-2017",

}

TY - GEN

T1 - Difference in distribution of eu ions doped CaF2 single crystal caused by two types of grown method by measurement of multi-photon luminescence

AU - Tanaka, Miho

AU - Ono, Shingo

AU - Yamaji, Akihiro

AU - Kurosawa, Shunsuke

AU - Yoshikawa, Akira

PY - 2017/11/22

Y1 - 2017/11/22

N2 - We report on distribution of Eu ions doped CaF2 single crystal by measurement of multi-photon luminescence. Distribution of Eu2+ and Eu3+ ions is measured respectively because the luminescence peak due to Eu2+ and Eu3+ ions is different. We observed the difference in distribution of Eu2+ and Eu3+ ions doped CaF2 which is grown by Annealing method and micro pulling-down method.

AB - We report on distribution of Eu ions doped CaF2 single crystal by measurement of multi-photon luminescence. Distribution of Eu2+ and Eu3+ ions is measured respectively because the luminescence peak due to Eu2+ and Eu3+ ions is different. We observed the difference in distribution of Eu2+ and Eu3+ ions doped CaF2 which is grown by Annealing method and micro pulling-down method.

KW - Europium

KW - Femtosecond laser

KW - Luminescence

KW - Multi-photon

UR - http://www.scopus.com/inward/record.url?scp=85044175658&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85044175658&partnerID=8YFLogxK

U2 - 10.1109/CLEOPR.2017.8119055

DO - 10.1109/CLEOPR.2017.8119055

M3 - Conference contribution

AN - SCOPUS:85044175658

VL - 2017-January

SP - 1

EP - 2

BT - 2017 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2017

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2017 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2017

Y2 - 31 July 2017 through 4 August 2017

ER -