Dielectric response functions studied by an all-electron mixed-basis approach

Soh Ishii, Kaoru Ohno, Yoshiyuki Kawazoe

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)


Dielectric response functions for Si and GaAs, which include local-field effects and frequency dependence, are calculated within the Local Density Approximation (LDA) using our original all-electron mixed-basis approach program. The results are in good agreement with other calculations. The local-field effects are small but not negligible for these materials.

Original languageEnglish
Pages (from-to)1209-1212
Number of pages4
JournalMaterials Transactions, JIM
Issue number11
Publication statusPublished - 1999

ASJC Scopus subject areas

  • Engineering(all)


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