Engineering
Gate Bias
100%
Electric Field
50%
Applied Electric Field
50%
Depletion
50%
Oxide System
50%
Potential Drop
50%
Band Structure
50%
Control Gate
50%
Hard X-Rays
50%
Detailed Model
50%
Demonstrates
50%
Simulation
50%
Lower Temperature
50%
Losses
50%
Alignment
50%
Dependent Dielectric Constant
50%
Chemistry
X-Ray Photoelectron Spectroscopy
100%
Dielectric Constant
50%
Electric Field
50%
Conductivity
50%
Transport Property
50%
Dielectric Material
50%
Electronic Band Structure
50%
Depth Profiling
50%
Electron Mobility
50%
Device
50%
Analytical Method
50%
Simulation
50%
Potential
50%
Physics
Collapse
100%
Electric Fields
50%
Dielectrics
50%
Transport Properties
50%
Electron Mobility
50%
Simulation
50%
Geometry
50%
Sides
50%
Material Science
Permittivity
100%
Dielectric Material
50%
Electron Mobility
50%
Computer Science
Applied Electric Field
50%
Measurement Report
50%
Simulation
50%