To evaluate the X-ray-induced afterglow phenomenon, we developed an ionizing-radiation-induced luminescence characterization system equipped with a pulse-width-tunable X-ray source. The system consists of a pulse X-ray tube and a detector system based on photon counting. The excitation pulse width was tunable from nano-to millisecond ranges, and the dynamic range of the X-ray-induced afterglow was 106. Conventional scintillators for X-ray CT or security systems, namely, Bi4Ge3O12, CdWO4, Tl-doped CsI, and Tb and Pr-codoped Gd2O 2S, were evaluated for the performance test. Results show that the afterglow time profiles of these scintillators are consistent with generally known results with high accuracy.
ASJC Scopus subject areas
- Physics and Astronomy(all)