Development of wavelength-dispersive soft X-ray emission spectrometers for transmission electron microscopes - An introduction of valence electron spectroscopy for transmission electron microscopy

Masami Terauchi, Masato Koike, Kurio Fukushima, Atsushi Kimura

    Research output: Contribution to journalArticlepeer-review

    30 Citations (Scopus)

    Abstract

    Two types of wavelength-dispersive soft X-ray spectrometers, a high-dispersion type and a conventional one, for transmission electron microscopes were constructed. Those spectrometers were used to study the electronic states of valence electrons (bonding electrons). Both spectrometers extended the acceptable energy regions to higher than 2000 eV. The best energy resolution of 0.08 eV was obtained for an Al L-emission spectrum by using the high-dispersion type spectrometer. By using the spectrometer, C K-emission of carbon allotropes, Cu L-emission of Cu1-xZnx alloys and Pt M-emission spectra were presented. The FWHM value of 12 eV was obtained for the Pt Mα-emission peak. The performance of the conventional one was also presented for ZnS and a section specimen of a multilayer device. W-M and Si-K emissions were clearly resolved. Soft X-ray emission spectroscopy based on transmission electron microscopy (TEM) has an advantage for obtaining spectra from a single crystalline specimen with a defined crystal setting. As an example of anisotropic soft X-ray emission, C K-emission spectra of single crystalline graphite with different crystal settings were presented. From the spectra, density of states of π- and σ-bondings were separately derived. These results demonstrated a method to analyse the electronic states of valence electrons of materials in the nanometre scale based on TEM.

    Original languageEnglish
    Pages (from-to)251-261
    Number of pages11
    JournalJournal of Electron Microscopy
    Volume59
    Issue number4
    DOIs
    Publication statusPublished - 2010 Aug

    Keywords

    • anisotropic soft X-ray emission
    • chemical shift
    • soft X-ray emission spectroscopy
    • transmission electron microscope
    • valence band
    • wavelength-dispersive spectroscopy

    ASJC Scopus subject areas

    • Instrumentation

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