Development of UHV-LT MFM operating in magnetic field

Hidetaka Sugaya, Taro Hitosugi, Toshihiro Shimada, Toshihiko Nagamura, Yuji Matsumoto, Tetsuya Hasegawa

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    We have developed an ultrahigh-vacuum low-temperature magnetic force microscope (UHV-LT MFM) which can operate in magnetic fields. The microscope is based on a non-contact atomic force microscope using a piezoelectric cantilever. Measurements of hard disc media confirmed spatial resolution of ∼50 nm even at low temperatures down to 10 K. The maximum scanning area is as wide as 2.5 μm × 2.5 μm at 10 K and 7.5 μm × 7.5 μm at room temperature. We have also equipped the microscope with an electromagnet in order to apply external magnetic fields up to 0.25 T in the horizontal direction. The MFM head is mounted on a piezo-driven rotation stage, so that the direction of magnetic field relative to the sample surface can be set arbitrarily.

    Original languageEnglish
    Title of host publicationLOW TEMPERATURE PHYSICS
    Subtitle of host publication24th International Conference on Low Temperature Physics - LT24
    Pages1667-1668
    Number of pages2
    DOIs
    Publication statusPublished - 2006 Dec 1
    EventLOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24 - Orlando, FL, United States
    Duration: 2006 Aug 102006 Oct 17

    Publication series

    NameAIP Conference Proceedings
    Volume850
    ISSN (Print)0094-243X
    ISSN (Electronic)1551-7616

    Other

    OtherLOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24
    CountryUnited States
    CityOrlando, FL
    Period06/8/1006/10/17

    Keywords

    • External field
    • Low temperature
    • MFM
    • Spatial resolution
    • UHV

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

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