Development of radiation sensor based on Pt/ZnO Schottky diode

S. Narita, Y. Nishibori, H. Naito, H. Ito, H. Endo, T. Chiba, Y. Sakemi, M. Itoh, H. Yoshida

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

We have fabricated the Pt/ZnO Schottky diode based on the single crystal substrate grown by the hydrothermal growth method. The output signals from the diode were analyzed for the incidence of x-rays and α-rays, and the clear responses for those radiations were observed. We have demonstrated a potential of the ZnO based device for ionizing radiations. In addition, we investigated the radiation hardness of the ZnO material irradiating the diode sample with the high energy proton beam. The electrical characteristics have not been significantly changed even after irradiation of 1015 protons/cm 2.

Original languageEnglish
Title of host publication2011 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2011
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1726-1729
Number of pages4
ISBN (Print)9781467301183
DOIs
Publication statusPublished - 2011 Jan 1
Event2011 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2011 - Valencia, Spain
Duration: 2011 Oct 232011 Oct 29

Publication series

NameIEEE Nuclear Science Symposium Conference Record
ISSN (Print)1095-7863

Other

Other2011 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2011
CountrySpain
CityValencia
Period11/10/2311/10/29

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Radiology Nuclear Medicine and imaging

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    Narita, S., Nishibori, Y., Naito, H., Ito, H., Endo, H., Chiba, T., Sakemi, Y., Itoh, M., & Yoshida, H. (2011). Development of radiation sensor based on Pt/ZnO Schottky diode. In 2011 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2011 (pp. 1726-1729). [6154669] (IEEE Nuclear Science Symposium Conference Record). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NSSMIC.2011.6154669