TY - JOUR
T1 - Development of novel system combining scanning tunneling microscope-based cathodoluminescence and electroluminescence nanospectroscopies
AU - Watanabe, Kentaro
AU - Nakamura, Yoshiaki
AU - Kuboya, Shigeyuki
AU - Katayama, Ryuji
AU - Onabe, Kentaro
AU - Ichikawa, Masakazu
PY - 2011/8/1
Y1 - 2011/8/1
N2 - Novel system equipped with conductive optical fiber probe scanning tunneling microscope (STM) and bipolar sample holder is a powerful tool to characterize light-emitting devices by several STM-based techniques at the same sample position, which can realize photoluminescence (PL), cathodoluminescence (CL), electroluminescence (EL), and electron beam induced current (EBIC) measurements with higher spatial resolutions than conventional techniques. In this study, we developed a STM-CL/EL system which combines STM-CL technique for high CL excitation power and high spatial resolution and STM-EL technique for local EL collection. We demonstrated spatially resolved STM-CL/EL spectroscopy of GaAs/AlGaAs heterostructure (110) cross-sections.
AB - Novel system equipped with conductive optical fiber probe scanning tunneling microscope (STM) and bipolar sample holder is a powerful tool to characterize light-emitting devices by several STM-based techniques at the same sample position, which can realize photoluminescence (PL), cathodoluminescence (CL), electroluminescence (EL), and electron beam induced current (EBIC) measurements with higher spatial resolutions than conventional techniques. In this study, we developed a STM-CL/EL system which combines STM-CL technique for high CL excitation power and high spatial resolution and STM-EL technique for local EL collection. We demonstrated spatially resolved STM-CL/EL spectroscopy of GaAs/AlGaAs heterostructure (110) cross-sections.
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U2 - 10.1143/JJAP.50.08LB18
DO - 10.1143/JJAP.50.08LB18
M3 - Article
AN - SCOPUS:80051978386
VL - 50
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 8 PART 4
M1 - 08LB18
ER -