Development of novel system combining scanning tunneling microscope-based cathodoluminescence and electroluminescence nanospectroscopies

Kentaro Watanabe; Yoshiaki Nakamura; Shigeyuki Kuboya; Ryuji Katayama; Kentaro Onabe; Masakazu Ichikawa

doi:10.1143/JJAP.50.08LB18

Development of novel system combining scanning tunneling microscope-based cathodoluminescence and electroluminescence nanospectroscopies

Kentaro Watanabe, Yoshiaki Nakamura, Shigeyuki Kuboya, Ryuji Katayama, Kentaro Onabe, Masakazu Ichikawa

Materials Design Division

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

Novel system equipped with conductive optical fiber probe scanning tunneling microscope (STM) and bipolar sample holder is a powerful tool to characterize light-emitting devices by several STM-based techniques at the same sample position, which can realize photoluminescence (PL), cathodoluminescence (CL), electroluminescence (EL), and electron beam induced current (EBIC) measurements with higher spatial resolutions than conventional techniques. In this study, we developed a STM-CL/EL system which combines STM-CL technique for high CL excitation power and high spatial resolution and STM-EL technique for local EL collection. We demonstrated spatially resolved STM-CL/EL spectroscopy of GaAs/AlGaAs heterostructure (110) cross-sections.

Original language	English
Article number	08LB18
Journal	Japanese journal of applied physics
Volume	50
Issue number	8 PART 4
DOIs	https://doi.org/10.1143/JJAP.50.08LB18
Publication status	Published - 2011 Aug 1

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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Development of novel system combining scanning tunneling microscope-based cathodoluminescence and electroluminescence nanospectroscopies. / Watanabe, Kentaro; Nakamura, Yoshiaki; Kuboya, Shigeyuki; Katayama, Ryuji; Onabe, Kentaro; Ichikawa, Masakazu.

In: Japanese journal of applied physics, Vol. 50, No. 8 PART 4, 08LB18, 01.08.2011.

Research output: Contribution to journal › Article › peer-review

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