Novel system equipped with conductive optical fiber probe scanning tunneling microscope (STM) and bipolar sample holder is a powerful tool to characterize light-emitting devices by several STM-based techniques at the same sample position, which can realize photoluminescence (PL), cathodoluminescence (CL), electroluminescence (EL), and electron beam induced current (EBIC) measurements with higher spatial resolutions than conventional techniques. In this study, we developed a STM-CL/EL system which combines STM-CL technique for high CL excitation power and high spatial resolution and STM-EL technique for local EL collection. We demonstrated spatially resolved STM-CL/EL spectroscopy of GaAs/AlGaAs heterostructure (110) cross-sections.
ASJC Scopus subject areas
- Physics and Astronomy(all)