A circular type multilayer Laue lens (MLL) has been designed and fabricated. A graded-thickness multilayer was deposited on a tapered wire core by using a magnetron sputtering system. A combination of MoSi
2 and Si was chosen as the multilayer materials owing to its superior properties of high diffraction efficiency and relatively sharp interfaces between layers. Optical properties of the circular type MLL were measured at BL24XU of SPring-8 with 20-keV x-rays. It was confirmed that only the +first-order diffraction was focused in the focal point owing to the wedged zone structure. Measured +first-order diffraction efficiency of the multilayer part was as high as 52%. Applying the circular type MLL to scanning transmission microscopy, a 50-nm line and space of a test chart was resolved.