Development of measuring equipment of DC-biased magnetic properties using of open type single sheet tester

T. Yoshida, M. Nakano, D. Miyagi, K. Fujiwara, N. Takahashi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)
Original languageEnglish
Title of host publicationINTERMAG 2006 - IEEE International Magnetics Conference
Number of pages1
DOIs
Publication statusPublished - 2006 Dec 1
EventINTERMAG 2006 - IEEE International Magnetics Conference - San Diego, CA, United States
Duration: 2006 May 82006 May 12

Publication series

NameINTERMAG 2006 - IEEE International Magnetics Conference

Other

OtherINTERMAG 2006 - IEEE International Magnetics Conference
CountryUnited States
CitySan Diego, CA
Period06/5/806/5/12

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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