Development of laboratory-based x-ray phase tomographic microscope

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Quantitative measurements of the phase shift of X-rays passing through a matter allow us to perform X-ray phase tomography for visualization of soft materials. Combination of an X-ray microscope and a grating interferometer is a promising approach to realize quantitative phase measurements with a microscopic spatial resolution. A Lau interferometer consisting of a source grating and a phase grating is available for this purpose with an incoherent laboratory X-ray source. We installed a Lau interferometer into a laboratory-based X-ray microscope adopting a copper rotating anode source and Fresnel zone plates (ZEISS Xradia 800 Ultra). A "twin-phase image", which consists of positive and negative phase images overlaid with a certain separation, is generated through a fringe-scanning measurement with this microscope. A step for generating a quantitative phase image from the twin phase image should be developed to perform phase tomography. However, conventional deconvolution operations are not suitable because of artifacts and noise remained in resultant phase images. To reduce the artifacts and noise, an iterative calculation algorithm has been developed. The evaluation of the algorithm shows that the artifacts and noise are suppressed and quantitative phase images are obtained. Finally, results of phase tomography obtained for soft materials are demonstrated.

Original languageEnglish
Title of host publicationDevelopments in X-Ray Tomography XII
EditorsBert Muller, Ge Wang
PublisherSPIE
ISBN (Electronic)9781510629196
DOIs
Publication statusPublished - 2019
Event12th SPIE Conference on Developments in X-Ray Tomography 2019 - San Diego, United States
Duration: 2019 Aug 132019 Aug 15

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11113
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference12th SPIE Conference on Developments in X-Ray Tomography 2019
CountryUnited States
CitySan Diego
Period19/8/1319/8/15

Keywords

  • Grating interferometry
  • Laboratory source
  • Phase contrast
  • X-ray microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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