Development of incident X-ray flux monitor for coherent X-ray diffraction microscopy

Yukio Takahashi, Hideto Kubo, Hayato Furukawa, Kazuto Yamauchi, Eiichiro Matsubara, Tetsuya Ishikawa, Yoshinori Nishino

Research output: Contribution to journalArticlepeer-review

Abstract

An incident X-ray flux monitor for coherent X-ray diffraction microscopy was developed. The intensities of x-rays passing through the sample were measured using an X-ray photodiode, with the simultaneous measurement of the X-ray diffraction intensities of the sample. As a result of the normalization of the X-ray diffraction intensities by the incident X-ray flux determined from the monitor, the fluctuation of the speckle intensities was successfully suppressed.

Original languageEnglish
Article number012060
JournalJournal of Physics: Conference Series
Volume186
DOIs
Publication statusPublished - 2009
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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