Development of high sensitivity X-ray multiple-times-diffraction enhanced imaging (M-DEI) optics

Yanlin Wu, Kazuyuki Hyodo, Naoki Sunaguchi, Tetsuya Yuasa, Masami Ando

Research output: Contribution to journalConference articlepeer-review

4 Citations (Scopus)


X-ray phase contrast imaging is now a powerful tool to identify tiny electronic-density difference in a subject. We propose a novel diffraction enhanced imaging (DEI) optics sensitive to the electronic-density difference smaller than 2%. This is named multiple-times-diffraction enhanced imaging (M-DEI) by use of multiple diffractions in a channel-cut groove. Ordinary DEI, which is widely utilized in many research fields, is sensitive to electronic-density difference greater than 2%. That the M-DEI adopts the multiple-times-diffraction in the Bragg case analyzer is a key point to obtain a sharp rise at the rocking curve which leads to the high electronic-density resolution. The X-ray energy was 17.5 keV, the diffraction index used was silicon (4, 4, 0), and the number of diffraction was 7. This gives 68.75% higher sensitivity of electronic-density difference compared to a single-times- diffraction. Here, we will report all recent results of the M-DEI system.

Original languageEnglish
Article number192008
JournalJournal of Physics: Conference Series
Issue numberPART 19
Publication statusPublished - 2013
Externally publishedYes
Event11th International Conference on Synchrotron Radiation Instrumentation, SRI 2012 - Lyon, France
Duration: 2012 Jul 92012 Jul 13

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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