X-ray phase contrast imaging is now a powerful tool to identify tiny electronic-density difference in a subject. We propose a novel diffraction enhanced imaging (DEI) optics sensitive to the electronic-density difference smaller than 2%. This is named multiple-times-diffraction enhanced imaging (M-DEI) by use of multiple diffractions in a channel-cut groove. Ordinary DEI, which is widely utilized in many research fields, is sensitive to electronic-density difference greater than 2%. That the M-DEI adopts the multiple-times-diffraction in the Bragg case analyzer is a key point to obtain a sharp rise at the rocking curve which leads to the high electronic-density resolution. The X-ray energy was 17.5 keV, the diffraction index used was silicon (4, 4, 0), and the number of diffraction was 7. This gives 68.75% higher sensitivity of electronic-density difference compared to a single-times- diffraction. Here, we will report all recent results of the M-DEI system.
|Journal||Journal of Physics: Conference Series|
|Issue number||PART 19|
|Publication status||Published - 2013|
|Event||11th International Conference on Synchrotron Radiation Instrumentation, SRI 2012 - Lyon, France|
Duration: 2012 Jul 9 → 2012 Jul 13
ASJC Scopus subject areas
- Physics and Astronomy(all)