Development of hard X-ray dark-field microscope using full-field optics

Hidekazu Takano, Hiroaki Azuma, Sho Shimomura, Takuya Tsuji, Yoshiyuki Tsusaka, Yasushi Kagoshima

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

We develop a dark-field X-ray microscope using full-field optics based on a synchrotron beamline. Our setup consists of a condenser system and a microscope objective with an angular acceptance larger than that of the condenser. The condenser system is moved downstream from its regular position such that the focus of the condenser is behind the objective. The dark-field microscope optics are configured by excluding the converging beam from the condenser at the focal point. The image properties of the system are evaluated by observing and calculating a Siemens star test chart with 10 keV X-rays. Our setup allows easy switching to bright-field imaging.

Original languageEnglish
Article number102401
JournalJapanese journal of applied physics
Volume55
Issue number10
DOIs
Publication statusPublished - 2016 Oct

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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