Development of grating interferometer-based stroboscopic X-ray tomography

Yanlin Wu; Hidekazu Takano; Atsushi Momose

doi:10.1117/12.2525576

Development of grating interferometer-based stroboscopic X-ray tomography

Yanlin Wu, Hidekazu Takano, Atsushi Momose

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

X-ray phase/dark-field tomography by using an X-ray grating interferometer and white synchrotron radiation has been demonstrated to observe dynamics in materials consisting of light elements, because it is available with X-rays of a broad energy bandwidth. In this work, we combined X-ray phase/dark-field tomography with a stroboscopic technique, which synchronizes image acquisitions with repetitive tension applied to a sample. Snapshot images with a 200 μs temporal resolution are measured to reconstruct phase/dark-field tomograms. A result of stroboscopic X-ray dark-field tomography is described, which was obtained for a rubber sample under a 24 Hz repetitive compression-stretch motion of a 10 mm amplitude.

Original language	English
Title of host publication	Developments in X-Ray Tomography XII
Editors	Bert Muller, Ge Wang
Publisher	SPIE
ISBN (Electronic)	9781510629196
DOIs	https://doi.org/10.1117/12.2525576
Publication status	Published - 2019 Jan 1
Event	12th SPIE Conference on Developments in X-Ray Tomography 2019 - San Diego, United States Duration: 2019 Aug 13 → 2019 Aug 15

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	11113
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	12th SPIE Conference on Developments in X-Ray Tomography 2019
Country	United States
City	San Diego
Period	19/8/13 → 19/8/15

Keywords

Compressionstretch motion
Dark-field tomography
Grating interferometer
Stroboscopic technique
Structural deformation
Synchrotron radiation
Talbot interferometer
Temporal resolution

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.2525576

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Cite this

Development of grating interferometer-based stroboscopic X-ray tomography. / Wu, Yanlin ; Takano, Hidekazu ; Momose, Atsushi.

Developments in X-Ray Tomography XII. ed. / Bert Muller; Ge Wang. SPIE, 2019. 111130Z (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11113).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Wu, Y , Takano, H & Momose, A 2019, Development of grating interferometer-based stroboscopic X-ray tomography. in B Muller & G Wang (eds), Developments in X-Ray Tomography XII., 111130Z, Proceedings of SPIE - The International Society for Optical Engineering, vol. 11113, SPIE, 12th SPIE Conference on Developments in X-Ray Tomography 2019, San Diego, United States, 19/8/13. https://doi.org/10.1117/12.2525576

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abstract = "X-ray phase/dark-field tomography by using an X-ray grating interferometer and white synchrotron radiation has been demonstrated to observe dynamics in materials consisting of light elements, because it is available with X-rays of a broad energy bandwidth. In this work, we combined X-ray phase/dark-field tomography with a stroboscopic technique, which synchronizes image acquisitions with repetitive tension applied to a sample. Snapshot images with a 200 μs temporal resolution are measured to reconstruct phase/dark-field tomograms. A result of stroboscopic X-ray dark-field tomography is described, which was obtained for a rubber sample under a 24 Hz repetitive compression-stretch motion of a 10 mm amplitude.",

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