Development of grating interferometer-based stroboscopic X-ray tomography

Yanlin Wu, Hidekazu Takano, Atsushi Momose

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)


X-ray phase/dark-field tomography by using an X-ray grating interferometer and white synchrotron radiation has been demonstrated to observe dynamics in materials consisting of light elements, because it is available with X-rays of a broad energy bandwidth. In this work, we combined X-ray phase/dark-field tomography with a stroboscopic technique, which synchronizes image acquisitions with repetitive tension applied to a sample. Snapshot images with a 200 μs temporal resolution are measured to reconstruct phase/dark-field tomograms. A result of stroboscopic X-ray dark-field tomography is described, which was obtained for a rubber sample under a 24 Hz repetitive compression-stretch motion of a 10 mm amplitude.

Original languageEnglish
Title of host publicationDevelopments in X-Ray Tomography XII
EditorsBert Muller, Ge Wang
ISBN (Electronic)9781510629196
Publication statusPublished - 2019
Event12th SPIE Conference on Developments in X-Ray Tomography 2019 - San Diego, United States
Duration: 2019 Aug 132019 Aug 15

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


Conference12th SPIE Conference on Developments in X-Ray Tomography 2019
Country/TerritoryUnited States
CitySan Diego


  • Compressionstretch motion
  • Dark-field tomography
  • Grating interferometer
  • Stroboscopic technique
  • Structural deformation
  • Synchrotron radiation
  • Talbot interferometer
  • Temporal resolution

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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