TY - GEN
T1 - Development of grating interferometer-based stroboscopic X-ray tomography
AU - Wu, Yanlin
AU - Takano, Hidekazu
AU - Momose, Atsushi
PY - 2019/1/1
Y1 - 2019/1/1
N2 - X-ray phase/dark-field tomography by using an X-ray grating interferometer and white synchrotron radiation has been demonstrated to observe dynamics in materials consisting of light elements, because it is available with X-rays of a broad energy bandwidth. In this work, we combined X-ray phase/dark-field tomography with a stroboscopic technique, which synchronizes image acquisitions with repetitive tension applied to a sample. Snapshot images with a 200 μs temporal resolution are measured to reconstruct phase/dark-field tomograms. A result of stroboscopic X-ray dark-field tomography is described, which was obtained for a rubber sample under a 24 Hz repetitive compression-stretch motion of a 10 mm amplitude.
AB - X-ray phase/dark-field tomography by using an X-ray grating interferometer and white synchrotron radiation has been demonstrated to observe dynamics in materials consisting of light elements, because it is available with X-rays of a broad energy bandwidth. In this work, we combined X-ray phase/dark-field tomography with a stroboscopic technique, which synchronizes image acquisitions with repetitive tension applied to a sample. Snapshot images with a 200 μs temporal resolution are measured to reconstruct phase/dark-field tomograms. A result of stroboscopic X-ray dark-field tomography is described, which was obtained for a rubber sample under a 24 Hz repetitive compression-stretch motion of a 10 mm amplitude.
KW - Compressionstretch motion
KW - Dark-field tomography
KW - Grating interferometer
KW - Stroboscopic technique
KW - Structural deformation
KW - Synchrotron radiation
KW - Talbot interferometer
KW - Temporal resolution
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U2 - 10.1117/12.2525576
DO - 10.1117/12.2525576
M3 - Conference contribution
AN - SCOPUS:85077801722
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Developments in X-Ray Tomography XII
A2 - Muller, Bert
A2 - Wang, Ge
PB - SPIE
T2 - 12th SPIE Conference on Developments in X-Ray Tomography 2019
Y2 - 13 August 2019 through 15 August 2019
ER -