Abstract
We have studied X-ray fluorescence analysis under glancing incidence and glancing take-off conditions. Recently, we have developed a third apparatus for detecting glancing-incidence and take-off X-ray fluorescence, which makes it possible to measure the incident-angle dependence, the take-off-angle dependence, X-ray reflectivity, and X-ray diffraction. Primarily, we have measured the take-off angular dependence of X-ray fluorescence using this apparatus. Glancing take-off X-ray fluorescence has some advantages in comparison with glancing-incidence X-ray fluorescence. The surface density and the absolute angles were determined by analysing the take-off angle dependence of the fluorescent X-rays emitted from identical atoms with the aid of the reciprocity theorem.
| Original language | English |
|---|---|
| Pages (from-to) | 841-846 |
| Number of pages | 6 |
| Journal | Spectrochimica Acta - Part B Atomic Spectroscopy |
| Volume | 52 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - 1997 Jul 1 |
Keywords
- Surface analysis
- Surface density
- Total reflection
- X-ray fluorescence
ASJC Scopus subject areas
- Analytical Chemistry
- Atomic and Molecular Physics, and Optics
- Instrumentation
- Spectroscopy