Fingerprint
Dive into the research topics of 'Development of evaluation method for estimating stress-induced change in drain current in deep-sub-micron MOSFETs'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Development of evaluation method for estimating stress-induced change in drain current in deep-sub-micron MOSFETs
Yukihiro Kumagai, Hiroyuki Ohta, Hideo Miura, Akihiro Shimizu, Shiro Kamohara, Keiichi Maekawa
Research output: Contribution to journal › Article › peer-review
1
Citation
(Scopus)