Development of double-probe piezo-driving holder for TEM

K. Yamazaki; I. Ishikawa; S. Deguchi; Y. Kondo; Y. Murakami; D. Shindo

doi:10.1017/S1431927608083165

Development of double-probe piezo-driving holder for TEM

K. Yamazaki, I. Ishikawa, S. Deguchi, Y. Kondo, Y. Murakami, D. Shindo

Center for Advanced Microscopy and Spectroscopy

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	814-815
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608083165
Publication status	Published - 2008 Aug 1

ASJC Scopus subject areas

Instrumentation

Access to Document

10.1017/S1431927608083165

Cite this

Yamazaki, K., Ishikawa, I., Deguchi, S., Kondo, Y., Murakami, Y., & Shindo, D. (2008). Development of double-probe piezo-driving holder for TEM. Microscopy and Microanalysis, 14(SUPPL. 2), 814-815. https://doi.org/10.1017/S1431927608083165

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