Development of band diagram measurement system

Shinjiro Yagyu, Michiko Yoshitake, Masahiro Goto, Toyohiro Chikyow

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

A band diagram measurement system was developed that consists of a spectrophotometer system and a photoemission yield measurement system, and is applicable to organic semiconductor materials such as organic light emitting devices (OLEDs). The system is designed to simultaneously measure optical (reflectance, luminescence, thickness and bandgap) and electronic properties (ionization potential and electron density of states) at the same position. A band diagram shows the absolute values of the highest occupied molecular orbital (HOMO) and lowest unoccupied molecular orbital (LUMO) energy levels from the vacuum level. The HOMO level is obtained from the ionization potential and the LUMO level is estimated from the HOMO and the optical bandgap. Band diagram measurements for typical organic semiconductor materials are demonstrated, and obtained band diagrams are in agreement with reported values.

Original languageEnglish
Pages (from-to)125-128
Number of pages4
JournalJournal of the Vacuum Society of Japan
Volume56
Issue number4
DOIs
Publication statusPublished - 2013

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation
  • Surfaces and Interfaces
  • Spectroscopy

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