An X-ray interferometer for high-resolution phase-contrast X-ray imaging was developed by thinning the central part of the analyzer crystal of a triple Laue-case (LLL) X-ray interferometer. The interferometer was examined by comparing it with an X-ray interferometer with a 1-mm analyzer at beamline 47× at the SPring-8 using 18.3-keV X-rays. The interferometer with a thinner analyzer can resolve smaller interference patterns with smaller deformation. The small stains in the phase-contrast images are due to the roughness of the analyzer surface formed during the chemical thinning process.
|Journal||Japanese Journal of Applied Physics, Part 2: Letters|
|Issue number||12 B|
|Publication status||Published - 1999|
ASJC Scopus subject areas
- Physics and Astronomy(all)