Development of an X-ray interferometer for high-resolution phase-contrast X-ray imaging

Keiichi Hirano, Atsushi Momose

Research output: Contribution to journalArticlepeer-review

21 Citations (Scopus)

Abstract

An X-ray interferometer for high-resolution phase-contrast X-ray imaging was developed by thinning the central part of the analyzer crystal of a triple Laue-case (LLL) X-ray interferometer. The interferometer was examined by comparing it with an X-ray interferometer with a 1-mm analyzer at beamline 47× at the SPring-8 using 18.3-keV X-rays. The interferometer with a thinner analyzer can resolve smaller interference patterns with smaller deformation. The small stains in the phase-contrast images are due to the roughness of the analyzer surface formed during the chemical thinning process.

Original languageEnglish
Pages (from-to)L1556-L1558
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume38
Issue number12 B
DOIs
Publication statusPublished - 1999

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

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