TY - GEN
T1 - Development of an in-situ structure/photo-absorption coincident measurement system for precise structure-optical property relationship research at SPring-8
AU - Kim, Jungeun
AU - Kato, Kenichi
AU - Moritomo, Yutaka
AU - Takata, Masaki
PY - 2010
Y1 - 2010
N2 - We have developed the structure and optical property coincident measurement system equipped with the photo-absorption system to the Large Debye-Scherrer Camera at BL44B2 of the SPring-8. Both photo-absorption detecting systems, the Si pin-photo diode for a 532 nm CW laser and the absorption spectrum covered the range of UV-IR (200∼1400 nm) for a white beam, are adopted. In order to verify the coincident measurement system, the X-ray powder diffraction and photo-absorption with the cyanide complex were performed individually and simultaneously under the temperature changes. As a result, the coincident measurement system performed successfully the one-to-one corresponding measurement between X-ray diffraction and photo-absorption. In addition, the monitoring of the photo-absorption informed us the property change of the material for the measurement condition and the sample transformation by temperature, laser etc. as well as damage by high-brilliance synchrotron radiation X-ray beam.
AB - We have developed the structure and optical property coincident measurement system equipped with the photo-absorption system to the Large Debye-Scherrer Camera at BL44B2 of the SPring-8. Both photo-absorption detecting systems, the Si pin-photo diode for a 532 nm CW laser and the absorption spectrum covered the range of UV-IR (200∼1400 nm) for a white beam, are adopted. In order to verify the coincident measurement system, the X-ray powder diffraction and photo-absorption with the cyanide complex were performed individually and simultaneously under the temperature changes. As a result, the coincident measurement system performed successfully the one-to-one corresponding measurement between X-ray diffraction and photo-absorption. In addition, the monitoring of the photo-absorption informed us the property change of the material for the measurement condition and the sample transformation by temperature, laser etc. as well as damage by high-brilliance synchrotron radiation X-ray beam.
KW - Coincident measurement
KW - photo-absorption
KW - powder diffraction
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U2 - 10.1063/1.3463184
DO - 10.1063/1.3463184
M3 - Conference contribution
AN - SCOPUS:77955027091
SN - 9780735407824
T3 - AIP Conference Proceedings
SP - 256
EP - 259
BT - SRI 2009 - The 10th International Conference on Synchrotron Radiation Instrumentation
T2 - 10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009
Y2 - 27 September 2009 through 2 October 2009
ER -