Development of an apparatus for in-situ near-field photoexcitation in a transmission electron microscope

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5 Citations (Scopus)

Abstract

An area observed with a transmission electron microscope (TEM) was illuminated with a far-field light probe (with a diameter of 10 μm) under the TEM observation. A tungsten tip covered with a silver layer (with a diameter of 60nm at the tip apex) was placed close to the observed area, and an intense near-field light was induced in the immediate vicinity of the tip apex due to a tip-enhanced effect. By using the near-field light probe with a high spatial resolution beyond the diffraction limit of light, photo-induced glide of an individual dislocation was demonstrated in ZnO.

Original languageEnglish
Article number125204
JournalApplied Physics Express
Volume5
Issue number12
DOIs
Publication statusPublished - 2012 Dec 1

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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