Development of a total reflection zone plate for hard X-ray focusing

Takuya Tsuji, Hidekazu Takano, Takahisa Koyama, Yoshiyuki Tsusaka, Yasushi Kagoshima

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)


A total reflection zone plate (TRZP) was developed and fabricated as a hard X-ray focusing device. It consists of a Au zone pattern drawn on a flat SiO2 substrate. The reflection only from the zone pattern can be extracted by operating the TRZP with a grazing incident angle between critical angles of Au and SiO2. The effective zone size is fully reduced to the drawn zone size with a small reduction ratio below 1/100. A focusing test using 10 keV X-rays was performed at the "Hyogo-ID" beamline (BL24XU) of SPring-8, and a focusing beam with diffraction-limited size was achieved.

Original languageEnglish
JournalJapanese journal of applied physics
Issue number3 PART 1
Publication statusPublished - 2010
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)


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