Development of a total reflection double-slit for evaluation of spatial coherence in hard X-ray region

T. Tsuji, T. Koyama, H. Takano, Y. Tsusaka, Y. Kagoshima

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

A new total reflection double-slit for hard X-ray region was developed. It consists of Au narrow stripes deposited on a SiO2 substrate and can function equivalently as a conventional Young's interferometer by operating with a small grazing incident angle. The Young's interferometer using the total reflection double-slit was constructed at Hyogo-ID BL of SPring-8, and the spatial coherence at 10 keV X-rays was evaluated by analyzing the interference fringes.

Original languageEnglish
Article number012061
JournalJournal of Physics: Conference Series
Volume186
DOIs
Publication statusPublished - 2009 Dec 1
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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