TY - GEN
T1 - Development of a three-dimensional integrated image sensor with pixel-parallel signal processing architecture
AU - Hagiwara, Kei
AU - Goto, Masahide
AU - Honda, Yuki
AU - Nanba, Masakazu
AU - Ohtake, Hiroshi
AU - Iguchi, Yoshinori
AU - Saraya, Takuya
AU - Kobayashi, Masaharu
AU - Toshiyoshi, Hiroshi
AU - Higurashi, Eiji
AU - Hiramoto, Toshiro
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/12/31
Y1 - 2015/12/31
N2 - A prototype sensor was built to demonstrate a 3D integrated CMOS image sensor that incorporates pixel-parallel signal processing architecture. FDSOI substrates with photodiodes and in-pixel ADC circuits were directly bonded after surface activation by plasma treatment. X, Y and θ alignment errors of 20 bonded samples were reduced to within ±0.7 μm, ±0.4 μm, and ±0.004°, respectively by using IR camera system. The resulting sensor successfully captured video images, thus demonstrating the feasibility of 3D integration technology and pixel-parallel architecture for future CMOS image sensors.
AB - A prototype sensor was built to demonstrate a 3D integrated CMOS image sensor that incorporates pixel-parallel signal processing architecture. FDSOI substrates with photodiodes and in-pixel ADC circuits were directly bonded after surface activation by plasma treatment. X, Y and θ alignment errors of 20 bonded samples were reduced to within ±0.7 μm, ±0.4 μm, and ±0.004°, respectively by using IR camera system. The resulting sensor successfully captured video images, thus demonstrating the feasibility of 3D integration technology and pixel-parallel architecture for future CMOS image sensors.
KW - 3D integration technology
KW - CMOS image sensor
KW - wafer bonding
UR - http://www.scopus.com/inward/record.url?scp=84963606450&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84963606450&partnerID=8YFLogxK
U2 - 10.1109/ICSENS.2015.7370672
DO - 10.1109/ICSENS.2015.7370672
M3 - Conference contribution
AN - SCOPUS:84963606450
T3 - 2015 IEEE SENSORS - Proceedings
BT - 2015 IEEE SENSORS - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 14th IEEE SENSORS
Y2 - 1 November 2015 through 4 November 2015
ER -