Development of a sub-eV resolution soft-X-ray spectrometer for a transmission electron microscope

Masami Terauchi, Hideto Yamamoto, Michiyoshi Tanaka

Research output: Contribution to journalArticle

27 Citations (Scopus)

Abstract

We constructed a grazing-incidence soft-X-ray spectrometer for a transmission electron microscope. The spectrometer, which was composed of a grating and a CCD detector, was attached to a JEM2000FX transmission electron microscope. B K-emission spectra of hexagonal boron-nitride, which give the density of states of the valence band of the material, were obtained with an energy resolution of about 0.6 eV.

Original languageEnglish
Pages (from-to)101-104
Number of pages4
JournalJournal of Electron Microscopy
Volume50
Issue number2
DOIs
Publication statusPublished - 2001 Jan 1

Keywords

  • B K-emission spectra
  • DOS of the valence band
  • Hexagonal boron-nitride
  • Soft-X-ray spectrometer
  • Transmission electron microscope
  • X-ray emission spectroscopy

ASJC Scopus subject areas

  • Instrumentation

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