Development of a sub-eV resolution soft-X-ray spectrometer for a transmission electron microscope

Masami Terauchi, Hideto Yamamoto, Michiyoshi Tanaka

    Research output: Contribution to journalArticlepeer-review

    27 Citations (Scopus)

    Abstract

    We constructed a grazing-incidence soft-X-ray spectrometer for a transmission electron microscope. The spectrometer, which was composed of a grating and a CCD detector, was attached to a JEM2000FX transmission electron microscope. B K-emission spectra of hexagonal boron-nitride, which give the density of states of the valence band of the material, were obtained with an energy resolution of about 0.6 eV.

    Original languageEnglish
    Pages (from-to)101-104
    Number of pages4
    JournalJournal of Electron Microscopy
    Volume50
    Issue number2
    DOIs
    Publication statusPublished - 2001

    Keywords

    • B K-emission spectra
    • DOS of the valence band
    • Hexagonal boron-nitride
    • Soft-X-ray spectrometer
    • Transmission electron microscope
    • X-ray emission spectroscopy

    ASJC Scopus subject areas

    • Instrumentation

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