Development of a novel straining holder for transmission electron microscopy compatible with single tilt-axis electron tomography

K. Sato, H. Miyazaki, T. Gondo, S. Miyazaki, M. Murayama, S. Hata

    Research output: Contribution to journalArticlepeer-review

    9 Citations (Scopus)

    Abstract

    We have developed a newly designed straining specimen holder for in situ transmission electron microscopy (TEM) compatible with high-angle single tilt-axis electron tomography. The holder can deform a TEM specimen under tensile stress with the strain rate between 1.5 × 10−6 and 5.2 × 10−3 s−1. We have also confirmed that the maximum tilt angle of the specimen holder reaches ±60° with a rectangular shape aluminum specimen. The new specimen holder, termed as ‘straining and tomography holder’, will have wide range potential applications in materials science.

    Original languageEnglish
    Pages (from-to)369-375
    Number of pages7
    JournalMicroscopy
    Volume64
    Issue number5
    DOIs
    Publication statusPublished - 2015 Oct

    Keywords

    • Dynamic 3D observation
    • Electron tomography
    • In situ deformation
    • In situ transmission electron microscopy

    ASJC Scopus subject areas

    • Structural Biology
    • Instrumentation
    • Radiology Nuclear Medicine and imaging

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