We have developed a newly designed straining specimen holder for in situ transmission electron microscopy (TEM) compatible with high-angle single tilt-axis electron tomography. The holder can deform a TEM specimen under tensile stress with the strain rate between 1.5 × 10−6 and 5.2 × 10−3 s−1. We have also confirmed that the maximum tilt angle of the specimen holder reaches ±60° with a rectangular shape aluminum specimen. The new specimen holder, termed as ‘straining and tomography holder’, will have wide range potential applications in materials science.
- Dynamic 3D observation
- Electron tomography
- In situ deformation
- In situ transmission electron microscopy
ASJC Scopus subject areas
- Structural Biology
- Radiology Nuclear Medicine and imaging