Development of a novel instrument for X-ray photoelectron diffraction and holography

Hideshi Ishii, Susumu Shiraki, Keiji Tamura, Wei guo Chu, Masanori Owari, Ryuichi Shimizu, Yoshimasa Nihei

    Research output: Contribution to journalArticlepeer-review

    10 Citations (Scopus)


    For X-ray photoelectron diffraction (XPED) and holography measurements we developed a novel laboratory instrument with the multienergy high power X-ray source and the high energy and high angular resolution photoelectron spectrometer system. The photon intensities of Al-Kα, Cr-Lα and Cu-Kα were estimated at 4.6 × 10 11 cps, 7.5 × 10 10 cps and 7.2 × 10 10 cps, respectively. Ag3d XPS also revealed that the energy resolutions of Al-Kα and Cr-Lα sources were 0.9 eV and 3.1 eV, respectively. XPS and XPED of h-BN/Ni(111) excited by Al-Kα and Cr-Lα elucidated the potential and the validity of the XPED and holography analysis by using this novel instrument. Cu-Kα excitation XPS and Tils XPED measurements of the SrTiO 3 (001) surface have also been performed.

    Original languageEnglish
    Pages (from-to)505-510
    Number of pages6
    JournalSurface Review and Letters
    Issue number2-3
    Publication statusPublished - 2003 Apr 1

    ASJC Scopus subject areas

    • Condensed Matter Physics
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films
    • Materials Chemistry


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