Development of a novel combined scanning electrochemical microscope (SECM) and scanning ion-conductance microscope (SICM) probe for soft sample imaging

Andrew J. Pollard, Nilofar Faruqui, Michael Shaw, Charles A. Clifford, Yasufumi Takahashi, Yuri E. Korchev, Neil Ebejer, Julie V. Macpherson, Patrick R. Unwin, Debdulal Roy

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

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    Engineering & Materials Science

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    Physics & Astronomy