Abstract
An EXAFS (extended X-ray absorption fine structure) spectrometer incorporating a rotating anode X-ray source and standard optics with flat crystal is described. By using a solid state detector to prevent harmonics and fast detection electronics to achieve a high count rate, the authors found that the conventional spectrometer can supply EXAFS spectra accurate enough for practical analysis. The systematic errors involved in EXAFS measurement are discussed in relation to the improvements designed into the present system.
| Original language | English |
|---|---|
| Pages (from-to) | 882-885 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes |
| Volume | 22 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - 1983 |
| Externally published | Yes |
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)