DEVELOPMENT OF A LABORATORY EXAFS FACILITY.

Kazuyuki Tohji, Yasuo Udagawa

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Abstract

An EXAFS (extended X-ray absorption fine structure) spectrometer incorporating a rotating anode X-ray source and standard optics with flat crystal is described. By using a solid state detector to prevent harmonics and fast detection electronics to achieve a high count rate, the authors found that the conventional spectrometer can supply EXAFS spectra accurate enough for practical analysis. The systematic errors involved in EXAFS measurement are discussed in relation to the improvements designed into the present system.

Original languageEnglish
Pages (from-to)882-885
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
Volume22
Issue number5
DOIs
Publication statusPublished - 1983 Jan 1

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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