Development of a high-performance angle-resolving electron energy analyzer

S. Shiraki, H. Ishii, Y. Nihei

    Research output: Contribution to journalConference articlepeer-review

    11 Citations (Scopus)

    Abstract

    An angle-resolving electron energy analyzer has been developed with a newly designed input-lens system. In this lens system, angle-resolving is accomplished by use of the diffraction plane aperture. Using this system, both high angular resolution and high transmission are easily performed in photoelectron diffraction (PED) measurements. In addition, the angular resolution is easily determined by the size of the diffraction plane aperture. In order to evaluate this analyzer, we measured the X-ray photoelectron diffraction (XPED) patterns from MgO(001) and CaF2(111) surfaces.

    Original languageEnglish
    Pages (from-to)1043-1048
    Number of pages6
    JournalJournal of Electron Spectroscopy and Related Phenomena
    Volume114-116
    DOIs
    Publication statusPublished - 2001 Mar
    Event8th International Conference on Electronic Spectroscopy and Structure (ICESS-8) - Berkeley, CA, USA
    Duration: 2000 Aug 82000 Aug 12

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Radiation
    • Atomic and Molecular Physics, and Optics
    • Condensed Matter Physics
    • Spectroscopy
    • Physical and Theoretical Chemistry

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