Development of a high-intensity photon-beam profile monitor

Takatsugu Ishikawa, Hisako Fujimura, Ryo Hashimoto, Yuki Honda, Takasln Ishida, Hiroki Kanda, Satoshi Kido, Yuji Matsumura, Manabu Mryabe, Ikuro Nagasawa, Ken'ichi Nanbu, Hajime Shimizu, Koutaku Suzuki, Ken Takahashi, Atsushi O. Tokiyasu, Yusuke Tsuchikawa, Hirohito Yamazaki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Several beam-profile monitors have been developed for high-energy photon beamlines at the Research Center for Electron Photon Science, Tohoku University, Japan. The position of the photon converted into an electron-positron pair in a metal plate is measured in these monitors. In the current monitor, two layers of 16 scintillating-fiber hodoscopes with a cross section of a 3-mm square have been adopted for the position measurement. The effective area is a 48 mm square. Events in which charged particles are produced upstream are rejected with a charge veto plastic scintillator placed in front of the plate, and pair-production events are identified with a trigger plastic scintillator placed behind the plate. The position is determined by a logic circuit with a field-programmable gate array. The dead time for processing an event is several tens of ns, and a high data acquisition efficiency can be achieved with these monitors for high-intensity photon beams (approximately 400 MHz). In the new developing monitor, the scintillating-fiber hodoscopes are planned to be replaced with a multi-anode metal-packaged photomultiplier tube. The secondary emission electrons produced at the photoelectric surface by the electron-positron pair are utilized for the position measurement. In this contribution, the overview of the developed monitor and prospects of the developing monitor will be discussed.

Original languageEnglish
Title of host publication2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509016426
DOIs
Publication statusPublished - 2017 Oct 16
Event2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 - Strasbourg, France
Duration: 2016 Oct 292016 Nov 6

Publication series

Name2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Volume2017-January

Other

Other2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
CountryFrance
CityStrasbourg
Period16/10/2916/11/6

ASJC Scopus subject areas

  • Radiology Nuclear Medicine and imaging
  • Instrumentation
  • Nuclear and High Energy Physics
  • Electronic, Optical and Magnetic Materials

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