Development of a fiber-laser-based frequency comb for precision dimensional metrology

Yuri Kanda, Hiraku Matsukuma, Shaoqing Yang, Yuki Shimizu, Hajime Inaba, Wei Gao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents the development of a frequency comb using a mode-locked fiber laser as the light source for precision dimensional metrology. The mode-locked laser generates an optical pulse train with a central wavelength of approximately 1560 nm. The pulse train was amplified with an erbium-doped fiber amplifier, and its spectrum was broadened to the wavelength range from 1000 nm to 2000 nm. Furthermore, the carrier envelope offset beats were successfully detected by using a common-path f-2 f interferometer.

Original languageEnglish
Title of host publicationProceedings of the 2018 IEEE International Conference on Advanced Manufacturing, ICAM 2018
EditorsTeen-Hang Meen
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages18-19
Number of pages2
ISBN (Electronic)9781538656099
DOIs
Publication statusPublished - 2019 Jan 16
Event2018 IEEE International Conference on Advanced Manufacturing, ICAM 2018 - Yunlin, Taiwan, Province of China
Duration: 2018 Nov 162018 Nov 18

Publication series

NameProceedings of the 2018 IEEE International Conference on Advanced Manufacturing, ICAM 2018

Conference

Conference2018 IEEE International Conference on Advanced Manufacturing, ICAM 2018
CountryTaiwan, Province of China
CityYunlin
Period18/11/1618/11/18

Keywords

  • F-2 f interferometer
  • Fiber laser
  • Mode-locked laser
  • Nonlinear polarization rotation

ASJC Scopus subject areas

  • Biomedical Engineering
  • Mechanics of Materials
  • Safety, Risk, Reliability and Quality
  • Management, Monitoring, Policy and Law
  • Education
  • Fluid Flow and Transfer Processes
  • Industrial and Manufacturing Engineering

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  • Cite this

    Kanda, Y., Matsukuma, H., Yang, S., Shimizu, Y., Inaba, H., & Gao, W. (2019). Development of a fiber-laser-based frequency comb for precision dimensional metrology. In T-H. Meen (Ed.), Proceedings of the 2018 IEEE International Conference on Advanced Manufacturing, ICAM 2018 (pp. 18-19). [8614857] (Proceedings of the 2018 IEEE International Conference on Advanced Manufacturing, ICAM 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/AMCON.2018.8614857