Development of a fiber-laser-based frequency comb for precision dimensional metrology

Yuri Kanda, Hiraku Matsukuma, Shaoqing Yang, Yuki Shimizu, Hajime Inaba, Wei Gao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents the development of a frequency comb using a mode-locked fiber laser as the light source for precision dimensional metrology. The mode-locked laser generates an optical pulse train with a central wavelength of approximately 1560 nm. The pulse train was amplified with an erbium-doped fiber amplifier, and its spectrum was broadened to the wavelength range from 1000 nm to 2000 nm. Furthermore, the carrier envelope offset beats were successfully detected by using a common-path f-2 f interferometer.

Original languageEnglish
Title of host publicationProceedings of the 2018 IEEE International Conference on Advanced Manufacturing, ICAM 2018
EditorsTeen-Hang Meen
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages18-19
Number of pages2
ISBN (Electronic)9781538656099
DOIs
Publication statusPublished - 2019 Jan 16
Externally publishedYes
Event2018 IEEE International Conference on Advanced Manufacturing, ICAM 2018 - Yunlin, Taiwan, Province of China
Duration: 2018 Nov 162018 Nov 18

Publication series

NameProceedings of the 2018 IEEE International Conference on Advanced Manufacturing, ICAM 2018

Conference

Conference2018 IEEE International Conference on Advanced Manufacturing, ICAM 2018
Country/TerritoryTaiwan, Province of China
CityYunlin
Period18/11/1618/11/18

Keywords

  • F-2 f interferometer
  • Fiber laser
  • Mode-locked laser
  • Nonlinear polarization rotation

ASJC Scopus subject areas

  • Biomedical Engineering
  • Mechanics of Materials
  • Safety, Risk, Reliability and Quality
  • Management, Monitoring, Policy and Law
  • Education
  • Fluid Flow and Transfer Processes
  • Industrial and Manufacturing Engineering

Fingerprint

Dive into the research topics of 'Development of a fiber-laser-based frequency comb for precision dimensional metrology'. Together they form a unique fingerprint.

Cite this