Deuterium retention in Ti1-xBx films deposited onto molybdenum by co-sputtering method

T. Shikama, T. Noda, M. Fukutomi, M. Okada

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)


Deuterium retention behavior was studied on Ti1-xBx films deposited onto molybdenum substrates by co-sputtering method. The coatings were irradiated by 6 keV D3+ to doses of 0.1-0.7 Coulomb at room temperature and then were heated up to about 1150 K with a temperature rise rate of 10 K/min. Desorption profiles and the amount of retention of irradiated deuterium were measured. The retention behavior was found to depend strongly on chemical composition of the films. The degree of crystallization also affected the retention behavior.

Original languageEnglish
Pages (from-to)156-159
Number of pages4
JournalJournal of Nuclear Materials
Issue numberPART 1
Publication statusPublished - 1986

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Materials Science(all)
  • Nuclear Energy and Engineering

Fingerprint Dive into the research topics of 'Deuterium retention in Ti<sub>1-x</sub>B<sub>x</sub> films deposited onto molybdenum by co-sputtering method'. Together they form a unique fingerprint.

Cite this