Determination of the thickness of a covering layer on a solid by Auger and electron energy-loss spectra without a standard sample

Masaoki Oku, Shigeru Suzuki, Kenji Abiko, Hiroshi Kimura, Kichinosuke Hirokawa

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

A semi-quantitative method is proposed for determining the thickness of a covering layer on a solid. The thickness is calculated from the intensity ratios between Auger electron spectra (AES) and core-electron energy-loss spectra (ELS) for the uncovered and covered surfaces. This method needs no standard sample or ion sputtering to estimate the thickness, although it involves a number of assumptions. It has been applied to the determination of the thickness of segregated phosphorus layers on intergranular fracture planes of FeP alloys, using a cylindrical-mirror electron analyzer.

Original languageEnglish
Pages (from-to)147-156
Number of pages10
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume23
Issue number2
DOIs
Publication statusPublished - 1981 Jan 1

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry

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