Determination of the thickness and distribution of a Langmuir-Blodgett film using soft X-ray reflection

A. Momose; Y. Hirai; I. Waki; S. Imazeki; Y. Tomioka; K. Hayakawa; M. Naito

doi:10.1016/0040-6090(89)90347-7

Determination of the thickness and distribution of a Langmuir-Blodgett film using soft X-ray reflection

A. Momose, Y. Hirai, I. Waki, S. Imazeki, Y. Tomioka, K. Hayakawa, M. Naito

Research output: Contribution to journal › Article › peer-review

20 Citations (Scopus)

Abstract

This paper reports the simultaneous observation of the thickness and distribution of XY-type Langmuir-Blodgett (LB) films by measurement of the reflectivity of soft X-rays using synchrotron radiation. The thickness and distribution are obtained by analysing the oscillation of the reflectivity, which is produced by varying the wavelength λ or grazing angle θ. The thickness obtained is compared with models of the XY-type deposition mechanism. It is shown that the molecular overturning model is the most satisfactory.

Original language	English
Pages (from-to)	519-523
Number of pages	5
Journal	Thin Solid Films
Volume	178
Issue number	1-2
DOIs	https://doi.org/10.1016/0040-6090(89)90347-7
Publication status	Published - 1989 Nov 1
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

Access to Document

10.1016/0040-6090(89)90347-7

Cite this

@article{8ee922f99f654e4e938fc0739e373ea3,

title = "Determination of the thickness and distribution of a Langmuir-Blodgett film using soft X-ray reflection",

abstract = "This paper reports the simultaneous observation of the thickness and distribution of XY-type Langmuir-Blodgett (LB) films by measurement of the reflectivity of soft X-rays using synchrotron radiation. The thickness and distribution are obtained by analysing the oscillation of the reflectivity, which is produced by varying the wavelength λ or grazing angle θ. The thickness obtained is compared with models of the XY-type deposition mechanism. It is shown that the molecular overturning model is the most satisfactory.",

author = "A. Momose and Y. Hirai and I. Waki and S. Imazeki and Y. Tomioka and K. Hayakawa and M. Naito",

year = "1989",

month = nov,

day = "1",

doi = "10.1016/0040-6090(89)90347-7",

language = "English",

volume = "178",

pages = "519--523",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

number = "1-2",

}

TY - JOUR

T1 - Determination of the thickness and distribution of a Langmuir-Blodgett film using soft X-ray reflection

AU - Momose, A.

AU - Hirai, Y.

AU - Waki, I.

AU - Imazeki, S.

AU - Tomioka, Y.

AU - Hayakawa, K.

AU - Naito, M.

PY - 1989/11/1

Y1 - 1989/11/1

N2 - This paper reports the simultaneous observation of the thickness and distribution of XY-type Langmuir-Blodgett (LB) films by measurement of the reflectivity of soft X-rays using synchrotron radiation. The thickness and distribution are obtained by analysing the oscillation of the reflectivity, which is produced by varying the wavelength λ or grazing angle θ. The thickness obtained is compared with models of the XY-type deposition mechanism. It is shown that the molecular overturning model is the most satisfactory.

AB - This paper reports the simultaneous observation of the thickness and distribution of XY-type Langmuir-Blodgett (LB) films by measurement of the reflectivity of soft X-rays using synchrotron radiation. The thickness and distribution are obtained by analysing the oscillation of the reflectivity, which is produced by varying the wavelength λ or grazing angle θ. The thickness obtained is compared with models of the XY-type deposition mechanism. It is shown that the molecular overturning model is the most satisfactory.

UR - http://www.scopus.com/inward/record.url?scp=0024768592&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0024768592&partnerID=8YFLogxK

U2 - 10.1016/0040-6090(89)90347-7

DO - 10.1016/0040-6090(89)90347-7

M3 - Article

AN - SCOPUS:0024768592

SN - 0040-6090

VL - 178

SP - 519

EP - 523

JO - Thin Solid Films

JF - Thin Solid Films

IS - 1-2

ER -

Determination of the thickness and distribution of a Langmuir-Blodgett film using soft X-ray reflection

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this