Determination of the spatial resolution of an aperture-type near-field scanning optical microscope using a standard sample of a quantum-dot-embedded polymer film

Jeongyong Kim, D. C. Kim, K. Nakajima, T. Mitsui, H. Aoki

    Research output: Contribution to journalArticle

    3 Citations (Scopus)

    Abstract

    The near-field scanning optical microscope (NSOM) is a form of scanning probe microscope that achieves, through the use of the near-field, a spatial resolution significantly superior to that defined by the Abbe diffraction limit. Although the term spatial resolution has a clear meaning, it is often used in different ways in characterizing the NSOM instrument. In this paper, we describe the concept, the cautions, and the general guidelines of a method to measure the spatial resolution of an aperture-type NSOM instrument. As an example, a quantum dot embedded polymer film was prepared and imaged as a test sample, and the determination of the lateral resolution was demonstrated using the described method.

    Original languageEnglish
    Pages (from-to)1748-1753
    Number of pages6
    JournalJournal of the Korean Physical Society
    Volume56
    Issue number6
    DOIs
    Publication statusPublished - 2010 Jun 15

    Keywords

    • NSOM
    • Near-field
    • Quantum dot
    • SNOM
    • Spatial resolution
    • Standard

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

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