Abstract
The near-field scanning optical microscope (NSOM) is a form of scanning probe microscope that achieves, through the use of the near-field, a spatial resolution significantly superior to that defined by the Abbe diffraction limit. Although the term spatial resolution has a clear meaning, it is often used in different ways in characterizing the NSOM instrument. In this paper, we describe the concept, the cautions, and the general guidelines of a method to measure the spatial resolution of an aperture-type NSOM instrument. As an example, a quantum dot embedded polymer film was prepared and imaged as a test sample, and the determination of the lateral resolution was demonstrated using the described method.
Original language | English |
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Pages (from-to) | 1748-1753 |
Number of pages | 6 |
Journal | Journal of the Korean Physical Society |
Volume | 56 |
Issue number | 6 |
DOIs | |
Publication status | Published - 2010 Jun 15 |
Keywords
- NSOM
- Near-field
- Quantum dot
- SNOM
- Spatial resolution
- Standard
ASJC Scopus subject areas
- Physics and Astronomy(all)