Determination of the number of graphene layers: Discrete distribution of the secondary electron intensity stemming from individual graphene layers

Hidefumi Hiura, Hisao Miyazaki, Kazuhito Tsukagoshi

Research output: Contribution to journalArticle

69 Citations (Scopus)

Abstract

Using a scanning electron microscope, we observed a reproducible, discrete distribution of secondary electron intensity stemming from an atomically thick graphene film on a thick insulating substrate. We found a distinct linear relationship between the relative secondary electron intensity from graphene and the number of layers, provided that a low primary electron acceleration voltage was used. Based on these observations, we propose a practical method to determine the number of graphene layers in a sample. This method is superior to the conventional optical method in terms of its capability to characterize graphene samples with sub-micrometer squares in area on various insulating substrates.

Original languageEnglish
Article number095101
JournalApplied Physics Express
Volume3
Issue number9
DOIs
Publication statusPublished - 2010 Sep 1
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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