Determination of the Fermi surface in high-Tc superconductors by angle-resolved photoemission spectroscopy

J. Mesot, M. Randeria, M. R. Norman, A. Kaminski, H. M. Fretwell, J. C. Campuzano, H. Ding, T. Takeuchi, T. Sato, T. Yokoya, T. Takahashi, I. Chong, T. Terashima, M. Takano, T. Mochiku, K. Kadowaki

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Abstract

We study the normal-state electronic excitations probed by angle-resolved photoemission spectroscopy (ARPES) in Bi1.6Pb0.4Sr2CuO6 (Bi2201) and Bi2Sr2CaCu2O8+δ (Bi2212). Our main goal is to establish explicit criteria for determining the Fermi surface from ARPES data on strongly interacting systems where sharply defined quasiparticles do not exist and the dispersion is very weak in parts of the Brillouin zone. Additional complications arise from strong matrix element variations within the zone. We present detailed results as a function of incident photon energy, and show simple experimental tests to distinguish between an intensity drop due to matrix element effects and spectral weight loss due to a Fermi crossing. We reiterate the use of polarization selection rules in disentangling the effect of umklapps due to the BiO superlattice in Bi2212. We conclude that, despite all the complications, the Fermi surface can be determined unambiguously; it is a single large hole barrel centered about (π, π) in both materials.

Original languageEnglish
Article number224516
Pages (from-to)2245161-22451614
Number of pages20206454
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume63
Issue number22
DOIs
Publication statusPublished - 2001

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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    Mesot, J., Randeria, M., Norman, M. R., Kaminski, A., Fretwell, H. M., Campuzano, J. C., Ding, H., Takeuchi, T., Sato, T., Yokoya, T., Takahashi, T., Chong, I., Terashima, T., Takano, M., Mochiku, T., & Kadowaki, K. (2001). Determination of the Fermi surface in high-Tc superconductors by angle-resolved photoemission spectroscopy. Physical Review B - Condensed Matter and Materials Physics, 63(22), 2245161-22451614. [224516]. https://doi.org/10.1103/PhysRevB.63.224516