Determination of proton and oxygen movements in solid oxides by the tracer gases exchange technique and secondary ion mass spectrometry

Teruhisa Horita; Katsuhiko Yamaji; Natsuko Sakai; Yueping Xiong; Tohru Kato; Harumi Yokokawa; Tatsuya Kawada

doi:10.1016/S0169-4332(02)00781-X

Determination of proton and oxygen movements in solid oxides by the tracer gases exchange technique and secondary ion mass spectrometry

Teruhisa Horita, Katsuhiko Yamaji, Natsuko Sakai, Yueping Xiong, Tohru Kato, Harumi Yokokawa, Tatsuya Kawada

ENV - Environmental Studies for Advanced Society

Research output: Contribution to journal › Article › peer-review

17 Citations (Scopus)

Abstract

The tracer gases exchange techniques were applied to the high temperature electrochemical ceramic devices to analyze the solubility of proton, diffusion of oxygen, and dynamics of oxygen reduction at ceramic interfaces. The secondary ion mass spectrometry (SIMS) analysis was conducted with quenched samples. The proton concentration in CeO ₂ based oxides was determined by D ₂ O saturation. The estimated concentration of proton was from 10 ^-3 to 10 ^-2 mol per 1mol oxide. Oxygen incorporation active points were visualized by scanning images of SIMS at the mesh-electrode/electrolyte interfaces. The SIMS scanning images clearly indicated that the O ₂ /electrode/electrolyte interfaces were most active points for oxygen incorporation.

Original language	English
Pages (from-to)	634-638
Number of pages	5
Journal	Applied Surface Science
Volume	203-204
DOIs	https://doi.org/10.1016/S0169-4332(02)00781-X
Publication status	Published - 2003 Jan 15

Keywords

Diffusion
High temperature electrochemical devices
Imaging
Isotope oxygen
Proton solubility
Solid oxide fuel cells

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Physics and Astronomy(all)
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1016/S0169-4332(02)00781-X

Cite this

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title = "Determination of proton and oxygen movements in solid oxides by the tracer gases exchange technique and secondary ion mass spectrometry",

abstract = " The tracer gases exchange techniques were applied to the high temperature electrochemical ceramic devices to analyze the solubility of proton, diffusion of oxygen, and dynamics of oxygen reduction at ceramic interfaces. The secondary ion mass spectrometry (SIMS) analysis was conducted with quenched samples. The proton concentration in CeO 2 based oxides was determined by D 2 O saturation. The estimated concentration of proton was from 10 -3 to 10 -2 mol per 1mol oxide. Oxygen incorporation active points were visualized by scanning images of SIMS at the mesh-electrode/electrolyte interfaces. The SIMS scanning images clearly indicated that the O 2 /electrode/electrolyte interfaces were most active points for oxygen incorporation.",

keywords = "Diffusion, High temperature electrochemical devices, Imaging, Isotope oxygen, Proton solubility, Solid oxide fuel cells",

author = "Teruhisa Horita and Katsuhiko Yamaji and Natsuko Sakai and Yueping Xiong and Tohru Kato and Harumi Yokokawa and Tatsuya Kawada",

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doi = "10.1016/S0169-4332(02)00781-X",

language = "English",

volume = "203-204",

pages = "634--638",

journal = "Applied Surface Science",

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publisher = "Elsevier",

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TY - JOUR

T1 - Determination of proton and oxygen movements in solid oxides by the tracer gases exchange technique and secondary ion mass spectrometry

AU - Horita, Teruhisa

AU - Yamaji, Katsuhiko

AU - Sakai, Natsuko

AU - Xiong, Yueping

AU - Kato, Tohru

AU - Yokokawa, Harumi

AU - Kawada, Tatsuya

PY - 2003/1/15

Y1 - 2003/1/15

N2 - The tracer gases exchange techniques were applied to the high temperature electrochemical ceramic devices to analyze the solubility of proton, diffusion of oxygen, and dynamics of oxygen reduction at ceramic interfaces. The secondary ion mass spectrometry (SIMS) analysis was conducted with quenched samples. The proton concentration in CeO 2 based oxides was determined by D 2 O saturation. The estimated concentration of proton was from 10 -3 to 10 -2 mol per 1mol oxide. Oxygen incorporation active points were visualized by scanning images of SIMS at the mesh-electrode/electrolyte interfaces. The SIMS scanning images clearly indicated that the O 2 /electrode/electrolyte interfaces were most active points for oxygen incorporation.

AB - The tracer gases exchange techniques were applied to the high temperature electrochemical ceramic devices to analyze the solubility of proton, diffusion of oxygen, and dynamics of oxygen reduction at ceramic interfaces. The secondary ion mass spectrometry (SIMS) analysis was conducted with quenched samples. The proton concentration in CeO 2 based oxides was determined by D 2 O saturation. The estimated concentration of proton was from 10 -3 to 10 -2 mol per 1mol oxide. Oxygen incorporation active points were visualized by scanning images of SIMS at the mesh-electrode/electrolyte interfaces. The SIMS scanning images clearly indicated that the O 2 /electrode/electrolyte interfaces were most active points for oxygen incorporation.

KW - Diffusion

KW - High temperature electrochemical devices

KW - Imaging

KW - Isotope oxygen

KW - Proton solubility

KW - Solid oxide fuel cells

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U2 - 10.1016/S0169-4332(02)00781-X

DO - 10.1016/S0169-4332(02)00781-X

M3 - Article

AN - SCOPUS:12244303613

VL - 203-204

SP - 634

EP - 638

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

ER -

Determination of proton and oxygen movements in solid oxides by the tracer gases exchange technique and secondary ion mass spectrometry

Abstract

Keywords

ASJC Scopus subject areas

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