Abstract
The tracer gases exchange techniques were applied to the high temperature electrochemical ceramic devices to analyze the solubility of proton, diffusion of oxygen, and dynamics of oxygen reduction at ceramic interfaces. The secondary ion mass spectrometry (SIMS) analysis was conducted with quenched samples. The proton concentration in CeO 2 based oxides was determined by D 2 O saturation. The estimated concentration of proton was from 10 -3 to 10 -2 mol per 1mol oxide. Oxygen incorporation active points were visualized by scanning images of SIMS at the mesh-electrode/electrolyte interfaces. The SIMS scanning images clearly indicated that the O 2 /electrode/electrolyte interfaces were most active points for oxygen incorporation.
Original language | English |
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Pages (from-to) | 634-638 |
Number of pages | 5 |
Journal | Applied Surface Science |
Volume | 203-204 |
DOIs | |
Publication status | Published - 2003 Jan 15 |
Keywords
- Diffusion
- High temperature electrochemical devices
- Imaging
- Isotope oxygen
- Proton solubility
- Solid oxide fuel cells
ASJC Scopus subject areas
- Chemistry(all)
- Condensed Matter Physics
- Physics and Astronomy(all)
- Surfaces and Interfaces
- Surfaces, Coatings and Films