Determination of proton and oxygen movements in solid oxides by the tracer gases exchange technique and secondary ion mass spectrometry

Teruhisa Horita, Katsuhiko Yamaji, Natsuko Sakai, Yueping Xiong, Tohru Kato, Harumi Yokokawa, Tatsuya Kawada

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

The tracer gases exchange techniques were applied to the high temperature electrochemical ceramic devices to analyze the solubility of proton, diffusion of oxygen, and dynamics of oxygen reduction at ceramic interfaces. The secondary ion mass spectrometry (SIMS) analysis was conducted with quenched samples. The proton concentration in CeO 2 based oxides was determined by D 2 O saturation. The estimated concentration of proton was from 10 -3 to 10 -2 mol per 1mol oxide. Oxygen incorporation active points were visualized by scanning images of SIMS at the mesh-electrode/electrolyte interfaces. The SIMS scanning images clearly indicated that the O 2 /electrode/electrolyte interfaces were most active points for oxygen incorporation.

Original languageEnglish
Pages (from-to)634-638
Number of pages5
JournalApplied Surface Science
Volume203-204
DOIs
Publication statusPublished - 2003 Jan 15

Keywords

  • Diffusion
  • High temperature electrochemical devices
  • Imaging
  • Isotope oxygen
  • Proton solubility
  • Solid oxide fuel cells

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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