Determination of crystal orientation by an area-detector image for surface X-ray diffraction

Wataru Yashiro, Shuji Kusano, Kazushi Miki

Research output: Contribution to journalArticlepeer-review

Abstract

A new method of calculating the crystal orientation matrix (U matrix) of a specified sample using two-dimensional X-ray diffraction spots that are recorded on an area detector is presented. In this way, the U matrix is calculated using at least three two-dimensional diffraction spots of known two-dimensional indices, which provide the projection of the crystal truncation rod onto the detector. The method, in the case of surface X-ray diffraction measurements with an area detector, enables easier and faster sample alignment than the conventional method to determine the U matrix.

Original languageEnglish
Pages (from-to)319-323
Number of pages5
JournalJournal of Applied Crystallography
Volume38
Issue number2
DOIs
Publication statusPublished - 2005 Apr 1
Externally publishedYes

ASJC Scopus subject areas

  • Biochemistry, Genetics and Molecular Biology(all)

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