Detection of X-ray induced current using a scanning tunneling microscope and its spatial mapping for elemental analysis

Kouichi Tsuji, Yukio Hasegawa, Kazuaki Wagatsuma, Toshio Sakurai

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

By using an external X-ray source for photoemission, an ultrahigh vacuum scanning tunneling microscope (UHV-STM) was successfully used to detect and map a tip current induced by X-ray irradiation simultaneously with a tunneling current. Apparent height in the STM image rises by the X-ray induced current on the Au/Cu(111) and Si(111)7×7 surfaces. Relative height increase of the Au overlayer to Cu substrate in STM images was found to depend on the X-ray irradiation, suggesting that it may be a promising tool for elemental analysis in STM.

Original languageEnglish
Pages (from-to)L1271-L1273
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume37
Issue number11 PART A
DOIs
Publication statusPublished - 1998 Nov 1

Keywords

  • Copper
  • Elemental analysis
  • Gold
  • Photoemission
  • Scanning tunneling microscope
  • Silicon
  • X-ray

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

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