Detection method for overclocking by intentional electromagnetic interference

Atsushi Nagao, Yuichiro Okugawa, Kazhiro Takaya, Yu-Ichi Hayashi, Naofumi Homma, Takafumi Aoki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)


Overclocking due to the disruption of a clock signal sometimes causes malfunctions (i.e., temporal faults) in LSI modules. It is known that electromagnetic interference can also cause overclocking. However, there is no specific method for detecting the occurrence of such overclocking in LSI modules. This paper proposes a method for detecting overclocking in LSI modules and its implementation as a detection circuit. We evaluate the validity of the proposed circuit through two kind of experiments (i) with a clock signal with artificially-inserted glitches and (ii) with CWs injected externally. From the 1st experiment, we confirm that our detection circuit can correctly determine whether overclocking (i.e., glitchy clock signal) is generated or not. From the 2nd experiment, we observe that the output sequence of our detection circuit indicates the occurrence of overclocking by injected CWs. At the same time, we also show the corresponding fluctuation in the voltage of clock signal due to the overlapped CW.

Original languageEnglish
Title of host publication2015 IEEE International Symposium on Electromagnetic Compatibility, EMC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages5
ISBN (Electronic)9781479966158
Publication statusPublished - 2015 Sep 10
EventIEEE International Symposium on Electromagnetic Compatibility, EMC 2015 - Dresden, Germany
Duration: 2015 Aug 162015 Aug 22

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118


OtherIEEE International Symposium on Electromagnetic Compatibility, EMC 2015


  • Continuous wave
  • Glitch
  • Intentional electromagnetic interference
  • LSI modules
  • Overclocking

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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