Detection and measurement of electroreflectance on quantum cascade laser device using Fourier transform infrared microscope

Eli Christopher I. Enobio, Keita Ohtani, Yuzo Ohno, Hideo Ohno

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

We demonstrate the use of a Fourier Transform Infrared microscope system to detect and measure electroreflectance (ER) from mid-infrared quantum cascade laser (QCL) device. To characterize intersubband transition (ISBT) energies in a functioning QCL device, a microscope is used to focus the probe on the QCL cleaved mirror. The measured ER spectra exhibit resonance features associated to ISBTs under applied electric field in agreement with the numerical calculations and comparable to observed photocurrent, and emission peaks. The method demonstrates the potential as a characterization tool for QCL devices.

Original languageEnglish
Article number231106
JournalApplied Physics Letters
Volume103
Issue number23
DOIs
Publication statusPublished - 2013 Dec 2

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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