Design of an STT-MTJ based true random number generator using digitally controlled probability-locked loop

Satoshi Oosawa, Takayuki Konishi, Naoya Onizawa, Takahiro Hanyu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

25 Citations (Scopus)

Abstract

This paper presents a design of a True Random Number Generator (TRNG) using a Spin Transfer Torque Magnetic Tunnel Junction (STT-MTJ) device. Since the probability of the STT-MTJ-based TRNG is locked using a digitally controlled feedback loop, the sensitivity of the feedback gain can be reduced greatly, which eliminates a high-gain amplifier in the feedback loop. It is demonstrated using the circuit simulator (NS-SPICE where the STT-MTJ model is established based on 90nm CMOS/MTJ process technologies) and MATLAB that the random sequences generated from the TRNG become 50%, where the gain of signal converters in the probability-locked loop is the precision of at most 9bit.

Original languageEnglish
Title of host publicationConference Proceedings - 13th IEEE International NEW Circuits and Systems Conference, NEWCAS 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479988938
DOIs
Publication statusPublished - 2015 Aug 6
Event13th IEEE International NEW Circuits and Systems Conference, NEWCAS 2015 - Grenoble, France
Duration: 2015 Jun 72015 Jun 10

Publication series

NameConference Proceedings - 13th IEEE International NEW Circuits and Systems Conference, NEWCAS 2015

Other

Other13th IEEE International NEW Circuits and Systems Conference, NEWCAS 2015
CountryFrance
CityGrenoble
Period15/6/715/6/10

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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