Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability

K. Watanabe; T. Shimada; K. Hirose; H. Shindo; D. Kobayashi; T. Tanigawa; S. Ikeda; T. Shinada; H. Koike; T. Endoh; T. Makino; T. Ohshima

doi:10.1109/IRPS48227.2022.9764491

Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability

K. Watanabe, T. Shimada, K. Hirose, H. Shindo, D. Kobayashi, T. Tanigawa, S. Ikeda, T. Shinada, H. Koike, T. Endoh, T. Makino, T. Ohshima

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We show our attempt to design space-grade low-power CMOS LSIs enhanced by magnetic tunnel junctions (MTJs). The validity is discussed by using high-energy heavy-ion experiments and macrospin simulations combined with single-event transient noise current modeling. Possible latent damage induced by heavy ions are also explored.

Original language	English
Title of host publication	2022 IEEE International Reliability Physics Symposium, IRPS 2022 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	P541-P545
ISBN (Electronic)	9781665479509
DOIs	https://doi.org/10.1109/IRPS48227.2022.9764491
Publication status	Published - 2022
Event	2022 IEEE International Reliability Physics Symposium, IRPS 2022 - Dallas, United States Duration: 2022 Mar 27 → 2022 Mar 31

Publication series

Name	IEEE International Reliability Physics Symposium Proceedings
Volume	2022-March
ISSN (Print)	1541-7026

Conference

Conference	2022 IEEE International Reliability Physics Symposium, IRPS 2022
Country/Territory	United States
City	Dallas
Period	22/3/27 → 22/3/31

Keywords

STT-MRAM
heavy ion
soft-error tolerance
space

ASJC Scopus subject areas

Engineering(all)

Access to Document

10.1109/IRPS48227.2022.9764491

Cite this

Watanabe, K., Shimada, T., Hirose, K., Shindo, H., Kobayashi, D., Tanigawa, T., Ikeda, S., Shinada, T., Koike, H., Endoh, T., Makino, T., & Ohshima, T. (2022). Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability. In 2022 IEEE International Reliability Physics Symposium, IRPS 2022 - Proceedings (pp. P541-P545). (IEEE International Reliability Physics Symposium Proceedings; Vol. 2022-March). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IRPS48227.2022.9764491

Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability. / Watanabe, K.; Shimada, T.; Hirose, K. et al.

2022 IEEE International Reliability Physics Symposium, IRPS 2022 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2022. p. P541-P545 (IEEE International Reliability Physics Symposium Proceedings; Vol. 2022-March).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Watanabe, K, Shimada, T, Hirose, K, Shindo, H, Kobayashi, D, Tanigawa, T, Ikeda, S , Shinada, T , Koike, H , Endoh, T, Makino, T & Ohshima, T 2022, Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability. in 2022 IEEE International Reliability Physics Symposium, IRPS 2022 - Proceedings. IEEE International Reliability Physics Symposium Proceedings, vol. 2022-March, Institute of Electrical and Electronics Engineers Inc., pp. P541-P545, 2022 IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, United States, 22/3/27. https://doi.org/10.1109/IRPS48227.2022.9764491

Watanabe K, Shimada T, Hirose K, Shindo H, Kobayashi D, Tanigawa T et al. Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability. In 2022 IEEE International Reliability Physics Symposium, IRPS 2022 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2022. p. P541-P545. (IEEE International Reliability Physics Symposium Proceedings). doi: 10.1109/IRPS48227.2022.9764491

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title = "Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability",

abstract = "We show our attempt to design space-grade low-power CMOS LSIs enhanced by magnetic tunnel junctions (MTJs). The validity is discussed by using high-energy heavy-ion experiments and macrospin simulations combined with single-event transient noise current modeling. Possible latent damage induced by heavy ions are also explored.",

keywords = "STT-MRAM, heavy ion, soft-error tolerance, space",

author = "K. Watanabe and T. Shimada and K. Hirose and H. Shindo and D. Kobayashi and T. Tanigawa and S. Ikeda and T. Shinada and H. Koike and T. Endoh and T. Makino and T. Ohshima",

note = "Funding Information: This work was supported in part by the Center for Innovative Integrated Electronic Systems (CIES) Industrial Affiliation on STT-MRAM Program and JST-OPERA. This work was also supported by the Support Program for starting up Innovation Hub on the National Research and Development Agency promoted by the Japan Science and Technology Agency (JST). Publisher Copyright: {\textcopyright} 2022 IEEE.; 2022 IEEE International Reliability Physics Symposium, IRPS 2022 ; Conference date: 27-03-2022 Through 31-03-2022",

year = "2022",

doi = "10.1109/IRPS48227.2022.9764491",

language = "English",

series = "IEEE International Reliability Physics Symposium Proceedings",

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AU - Hirose, K.

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AU - Kobayashi, D.

AU - Tanigawa, T.

AU - Ikeda, S.

AU - Shinada, T.

AU - Koike, H.

AU - Endoh, T.

AU - Makino, T.

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PY - 2022

Y1 - 2022

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AB - We show our attempt to design space-grade low-power CMOS LSIs enhanced by magnetic tunnel junctions (MTJs). The validity is discussed by using high-energy heavy-ion experiments and macrospin simulations combined with single-event transient noise current modeling. Possible latent damage induced by heavy ions are also explored.

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Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability

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