Depth profiling the potential in perovskite oxide heterojunctions using photoemission spectroscopy

M. Minohara, K. Horiba, H. Kumigashira, E. Ikenaga, M. Oshima

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

The authors report on the potential profiling in depth for promising oxide heterojunctions: La 0.6Sr 0.4MnO 3 (LSMO)/Nb-doped SrTiO 3 (Nb:STO) having different interfacial terminating layer and SrRuO 3/Nb:STO heterojunctions. The precise depth-profiling analysis of LSMO/TiO 2-Nb:STO interfaces with -La 0.6Sr 0.4O/TiO 2/SrO- structure reveals the existence of a certain thin depletion layer of 1-2 nm with an abrupt potential drop near the interface. In contrast, the ideal depletion layer is formed for other interfaces with a -SrO/TiO 2/SrO- terminating layer. These results suggest that the adjacency of TiO 2 layer with La 0.6Sr 0.4O donor layers at the interface is responsible for the formation of the thin depletion layer near the interface.

Original languageEnglish
Article number165108
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume85
Issue number16
DOIs
Publication statusPublished - 2012 Apr 6
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Depth profiling the potential in perovskite oxide heterojunctions using photoemission spectroscopy'. Together they form a unique fingerprint.

  • Cite this